About the Reviewer

Bowen Wei is a senior software engineer and data scientist at IBM IoT Analytics.

He focuses on predictive asset maintenance, visual inspection, and deep learning. He is the lead in the data science team and IoT analytic solution team. He is currently doing research in the abnormal detection and deep learning image classification areas.
He joined the IBM SPSS Modeler development team in 2010 and was transferred to the analytic solution team in 2013.